editorial series
ATX Fall For Fashion 2012
the method to the madness
Chaotic beauty: Backstage with five top designers at New York Fashion Week
Sep 18, 2012 | 6:14 pm
Photo by Niraj Mehdiratta
A great deal of work goes into the few minutes of glory models have when walking down the runway. CultureMap was behind the scenes at New York Fashion Week, getting the scoop on the beauty philosophies that capped off designers' visions and witnessing the method to the madness. (Right: Model at Richard Chai)